DELMIC

Will you be attending the CryoOz 2023 Symposium this week? Visit our poster presentation by Wessel Teunisse to discover how to enhance your Cryo-ET workflow.

We can't wait to connect with you there! See you soon!

Taking SiC-powered MOSFETs to space - how hard could that be?

Well, it was found that heavy-ion irradiation in space damages these devices. Using cathodoluminescence spectroscopy, researchers have recently investigated the different types of defects that occur in detail.

Read more in our new blog post: https://bit.ly/3MfSMG6

SiC-Powered MOSFETs: Defect Formation In Space Discover how researchers investigate defect formation in irradiated SiC-powered MOSFETs in space using cathodoluminescence spectroscopy.

Do you know how the camera of a cryo fluorescence light microscope influences the quality of fluorescent images?

Discover in our blog post which parameters you should pay extra attention to when choosing a camera, and how they affect your final result. Read it here: https://bit.ly/3RY6CAJ

How to choose a suitable camera for cryo-fluorescence light microscopy? Discover which parameters to consider when choosing a camera for a cryo-fluorescence system, and how they will define the fluorescence image quality.

Volume electron microscopy (vEM) techniques could revolutionize the way in which life science research is being done - but their low throughput is a major bottleneck.

Discover in our new blog post how this challenge has inspired the development of our fast and automated electron microscopy: The FAST-EM.

Read it here: https://bit.ly/3ZLMljA

Increasing the throughput of volume electron microscopy with FAST-EM Discover how a need for a more automated volume electron microscopy (vEM) workflow with higher throughput has led to the development of the FAST-EM.