RHK Technology - Integrated Surface Science Solutions

New research by György Kálvin of the HUN-REN Centre for Energy Research and collaborators reveals how even trace amounts of ambient contamination can impact ultra-sensitive surface measurements at the nanoscale. Conducted using an RHK PanScan Freedom system at cryogenic temperatures (8.7 K) under ultra-high vacuum, the study highlights just how critical pristine conditions are for accurate scanning tunneling microscopy and spectroscopy.

The paper features detailed STM images showing how surface contamination evolves and affects measurement quality, offering a clear visual look at these otherwise invisible effects.

🔬 Read the full article here: https://arxiv.org/abs/2511.04257

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